Application of Third Generation Semiconductor Testing Equipment -- Reed and Mercury Relay Series
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The third generation semiconductor silicon carbide (SiC), gallium nitride (GaN), etc. require high voltage and high current testing, requiring relays to have high switching voltage and withstand voltage, while also needing to withstand high current pulse capability. MiGaoLai Electronics uses mature mercury tubes and reed switches internationally, providing a series of relays that can meet the requirements of third generation semiconductor testing equipment through rigorous internal screening tests.
High Insulation Resistance
High insulation has always been the goal pursued by semiconductor testing equipment. Under a voltage of 1000V, the leakage current must be less than 0.1nA, which requires the relay's insulation resistance to be above 10T ohms. The HGFR series mercury relays and HVFG series reed relays developed by MiGaoLai Electronics use special processes to ensure that the insulation resistance between contacts and between contacts and coils fully meets customer needs.
High Voltage Resistance
As the first choice for testing third generation semiconductor devices, MiGaoLai relays have high insulation withstand voltage characteristics, with reed relays reaching up to 20KV and mercury relays exceeding 10KV.
Long Switching Life
Semiconductor packaging testing factories operate twenty-four hours a day without interruption, requiring high switching efficiency from relays. MiGaoLai reed relays have a switching time of within 1.2ms, achieving hundreds of switches per second, easily meeting customer efficiency demands; at the same time, the contact coating uses rare metal rhodium material to ensure the stability of contact resistance after switching billions of times, meeting the requirements for high switching life.
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